XRF-1800 X-Ray
XRF-1800 X-Ray Floresans Spektrometre (Sequential)
XRF 1800 Wavelength dispersive systems, which provide outstanding detection of trace substances from sub-ppm-level to 100 %., enables the analysis of elements from Beryllium (Be) to Uranium (U). Since samples can be analyzed non-destructively and without contacting the sample, X-ray fluorescence spectrometers can be used for a wide range of applications, regardless of whether the sample is a solid, liquid, powder or other form.
The XRF-1800 provides local analysis and 250 μm mapping capabilities as standard features, enabling reliable analysis of only a 500 μm in diameter for content distribution and intensity distribution analyses of non-uniform samples.
Producer:
Product Description
XRF-1800 X-Ray Floresans Spektrometre (Sequential)
XRF 1800 Wavelength dispersive systems, which provide outstanding detection of trace substances from sub-ppm-level to 100 %., enables the analysis of elements from Beryllium (Be) to Uranium (U). Since samples can be analyzed non-destructively and without contacting the sample, X-ray fluorescence spectrometers can be used for a wide range of applications, regardless of whether the sample is a solid, liquid, powder or other form.
The XRF-1800 provides local analysis and 250 μm mapping capabilities as standard features, enabling reliable analysis of only a 500 μm in diameter for content distribution and intensity distribution analyses of non-uniform samples.
Technical specifications
Features:
Sample of mapping (rare earth)
- World first 250µm Mapping for wavelength dispersive analysis (patented). This enables to analyze content distribution and intensity distribution of non uniform sample.
Sample of analysis (blue: First-order X-ray profile, red: Higher-order X-ray profile)
- Qualitative/quantitative analysis using higher-order X-rays (patent pending). More accurate evaluation of higher-order X-rays makes higher.
- Film thickness measurement and inorganic component analysis for high-polymer thin films with background FP method (patented).
- Local analysis
- CCD camera option for sample position designation (patent pending).
- 4 kW thin-window X-ray tube for high reliability and long life. Compared with conventional 3 kW tube, more than double of sensitivity is achieve in light elements.
- Ease of use – template and matching functions based on Shimadzu expertise. Optimal conditions can be created based on prepared conditions for sample forms like liquid, powder, solid, metal and oxides.