TOC-V

TOC-VW Total Organic Carbon Analyzer (Wet Type) Chemical Oxidation Technique

 
  • Trace level TOC measurement in ultra-pure water.
  • Capable of TC (total carbon), IC (inorganic carbon), TOC (total organic carbon),  NPOC (non-purgeable organic carbon) measurments
  • Powerful oxidation through a combination of peroxysulfuric acid, UV illumination and heating.

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Product Description

TOC-VW Total Organic Carbon Analyzer (Wet Type) Chemical Oxidation Technique

 
  • Trace level TOC measurement in ultra-pure water.
  • Capable of TC (total carbon), IC (inorganic carbon), TOC (total organic carbon),  NPOC (non-purgeable organic carbon) measurments
  • Powerful oxidation through a combination of peroxysulfuric acid, UV illumination and heating.

Technical specifications

TOC-V wet type series have a high-sensitivity NDIR which achieves ultrahigh sensitivity measurements. Sensitivity and accuracy enhanced by minimizing the reagent blanks that hinder accurate analysis. Powerful oxidation through a combination of peroxosulfuric acid, UV illumination, and heating.

Measurement Principle

TC Measurement

Phosphoric acid and the oxidant (persulfate) are added to the sample, which is heated under UV illumination to convert the TC in the sample to carbon dioxide. This carbon dioxide flows with the carrier gas via the dehumidifier into the NDIR sample cell. The area of the carbon dioxide peak signal is measured and this peak area is converted to TC concentration using a pre-prepared calibration curve.

 

IC Measurement

The sample is acidified with phosphoric acid and sparged to convert the IC in the sample to carbon dioxide. This carbon dioxide is detected by the NDIR and the sample IC concentration is measured in the same way as TC.

 

TOC Measurement

Subtracting the IC concentration from the TC concentration determines the TOC concentration.

 

NPOC Measurement

The sample is acidified with phosphoric acid and sparged to eliminate the IC. The NPOC concentration is determined by measuring the TC (=NPOC) of the sample after the IC is eliminated, using the same method as for TC measurement.